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Joint Test Action Group
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#	Item
621	Design Planning Strategies to Improve Physical Design Flows— Floorplanning and Power Planning August 2003 Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:32:47 Physical design Integrated circuit design Floorplan Placement Standard cell Application-specific integrated circuit Timing closure Signal integrity Joint Test Action Group Electronic engineering Electronic design automation Electronics
622	AN 586: Porting the Jam STAPL and Jam STAPL Byte-Code Players to an Embedded System © August[removed]AN[removed] Add to Reading List Source URL: www.altera.com Language: English - Date: 2009-08-17 16:16:22 Computer programming Electronics manufacturing Joint Test Action Group Memory management Embedded system C dynamic memory allocation C Pointer Operating system Computing Software engineering C Standard Library
623	CoreSight Debug and Trace Add to Reading List Source URL: www.altera.com Language: English Electronic engineering Electronics manufacturing Joint Test Action Group Computing Advanced Microcontroller Bus Architecture Field-programmable gate array ARM architecture Debugger Electronics Embedded systems IEEE standards
624	August 25, 1998 USE OF SX SERIES DEVICES AND IEEE[removed]JTAG CIRCUITRY Add to Reading List Source URL: klabs.org Language: English - Date: 2009-01-17 09:42:46 Electronic engineering Embedded systems IEEE standards Joint Test Action Group Boundary scan Serial Vector Format Electronics manufacturing Manufacturing Electronics
625	Processor Architecture, Nios II Processor Reference Handbook Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-02-14 18:17:39 Central processing unit Nios II Joint Test Action Group Instruction set Nios embedded processor Microarchitecture Computer architecture Computer hardware Computer engineering
626	Analyzing and Debugging Designs with System Console Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-06-19 13:48:14 Electronic engineering IEEE standards Nios II Joint Test Action Group Debugging Debugger In-circuit emulator Altera Video game console Embedded systems Electronics Computing
627	Nios II Processor Reference Handbook Nios II Processor Reference Handbook 101 Innovation Drive Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-02-14 18:16:43 Nios II Nios embedded processor Embedded systems Altera Soft microprocessor Field-programmable gate array Joint Test Action Group Multi-core processor GNU Compiler Collection Computing Software Electronics
628	Piksi Datasheet Flexible, high-performance GPS receiver platform running open-source software Features Add to Reading List Source URL: docs.swiftnav.com Language: English - Date: 2013-06-18 19:12:09 Embedded systems ARM architecture Microcontrollers Electronics manufacturing Joint Test Action Group STM32 Universal Serial Bus Booting Universal asynchronous receiver/transmitter Electronic engineering Computer hardware Electronics
629	AVR Bootloader FAQ Written by Brad Schick with contributions and editing by Cliff Lawson. Last updated: May 19, 2009 Planning to create a custom bootloader? This document answers many of the questions Add to Reading List Source URL: blog.schicks.net Language: English - Date: 2009-09-07 17:51:28 Computing Booting Firmware Joint Test Action Group Atmel AVR Embedded systems Electronics Computer architecture
630	Embedded Peripheral IP User Guide Subscribe Send Feedback UG-01085 Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-07-29 13:49:26 Electronics manufacturing Joint Test Action Group Universal asynchronous receiver/transmitter Conventional PCI RS-232 Interrupt request Serial Peripheral Interface Bus LEON Computing Electronics Computer hardware

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